Professor and Roscoe H. George Chair of Electrical and Computer Engineering
Electrical and Computer Engineering Department
Purdue University, West Lafayette, Indiana, USA

Device and Circuit Considerations for sub-22nm Technologies

The device electrostatics is expected to get worse in the sub-22nm technologies, device parameter variability will increase, while leakage power consumption is expected to increase considerably. Hence, there is a need to consider new device architectures and circuit design methodologies to cope with the problem. In this lecture, I will cover single gate and multi-gate devices that can potentially mitigate the above problems and will discuss both logic and memory  design for low leakage and improved error resilience. Finally, I will also cover the recent work on spin-devices and the possibilities in designing both memory and logic in future technology generations.

 

About the speaker:

Kaushik Roy received B.Tech. degree in electronics and electrical communications engineering from the Indian Institute of Technology, Kharagpur, India, and Ph.D. degree from the electrical and computer engineering department of the University of Illinois at Urbana-Champaign in 1990. He was with the Semiconductor Process and Design Center of Texas Instruments, Dallas, where he worked on FPGA architecture development and low-power circuit design. He joined the electrical and computer engineering faculty at Purdue University, West Lafayette, IN, in 1993, where he is currently a Professor and holds the Roscoe H. George Chair of Electrical & Computer Engineering. His research interests include Spintronics, VLSI design/CAD for nano-scale Silicon and non-Silicon technologies, low-power electronics for portable computing and wireless communications, VLSI testing and verification, and reconfigurable computing. Dr. Roy has published more than 500 papers in refereed journals and conferences, holds 15 patents, graduated 50 PhD students, and is co-author of two books on Low Power CMOS VLSI Design (John Wiley & McGraw Hill).

Dr. Roy received the National Science Foundation Career Development Award in 1995, IBM faculty partnership award, ATT/Lucent Foundation award, 2005 SRC Technical Excellence Award, SRC Inventors Award, Purdue College of Engineering Research Excellence Award, Humboldt Research Award in 2010, and best paper awards at 1997 International Test Conference, IEEE 2000 International Symposium on Quality of IC Design, 2003 IEEE Latin American Test Workshop, 2003 IEEE Nano, 2004 IEEE International Conference on Computer Design, 2006 IEEE/ACM International Symposium on Low Power Electronics & Design, and 2005 IEEE Circuits and system society Outstanding Young Author Award (Chris Kim), 2006 IEEE Transactions on VLSI Systems best paper award. Dr. Roy is Purdue University Faculty Scholar. He was a Research Visionary Board Member of Motorola Labs (2002) and held the M.K. Gandhi Distinguished Visiting faculty at Indian Institute of Technology (Bombay). He has been in the editorial board of IEEE Design and Test, IEEE Transactions on Circuits and Systems, and IEEE Transactions on VLSI Systems. He was Guest Editor for Special Issue on Low-Power VLSI in the IEEE Design and Test (1994) and IEEE Transactions on VLSI Systems (June 2000), IEE Proceedings -- Computers and Digital Techniques (July 2002). Dr. Roy is a fellow of IEEE.