Professor
Department of Electrical Engineering and Computer Science
University of Michigan, Ann Arbor, MI - USA
Webpage

On-Chip Monitoring for Self-Improvement

I will discuss recent progress in on-chip variability and wearout sensing, particularly in situ approaches.  One example is a demonstration of dynamic reliability management enabled by compact NBTI sensors.  I will also review some recent chip designs from Michigan that can serve as jumping off points for variability-aware design testbeds.

 

About the speaker:
Dennis Sylvester received his PhD from the University of California, Berkeley and is now Professor of Electrical Engineering and Computer Science at the University of Michigan, Ann Arbor. He previously held research staff positions in the Advanced Technology Group of Synopsys, Hewlett-Packard Laboratories, and a visiting professorship in Electrical and Computer Engineering at the National University of Singapore. He has published over 275 articles along with one book and several book chapters in his field of research, which includes low-power circuit design and design automation techniques, design-for-manufacturability, and interconnect modeling. He holds 6 US patents and serves as a consultant and technical advisory board member for electronic design automation and semiconductor firms in these areas.  He is co-founder of Ambiq Micro, a fabless semiconductor company developing ultra-low power mixed-signal solutions for compact wireless devices.  He is an IEEE Fellow.