An Outlook of Technology Scaling Beyond Moore's Law

Adrian Ionescu, Assistant Professor, Electronics Laboratory, EPFL

 

About the speaker: Adrian Ionescu was born in Romania, in 1965. He received his BSEE/MSE degree from the Polytechnic University of Bucharest in 1989. He holds a PhD degree in Microelectronics from Polytechnic University of Bucharest (1994) and a second PhD in Physics of Semiconductors from the National Polytechnic Institute of Grenoble (1997).

He was employed as Postdoctoral fellow at LETI-CEA, Grenoble, France and for a short time as 'Chargé de Recherche' at LPCS-CNRS, Grenoble, France. He spent 6 months as Visiting Researcher at the Center for Integrated Systems, Stanford University, California. Currently he is an Assistant Professor at Electronics Laboratory, EPFL.

Since 1992 he has worked on the modeling and electrical characterization of silicon-based semiconductor devices, especially SOI MOSFETs, and SOI materials. His current interests are on modeling and characterization of submicron MOS devices, SOI novel applications, RF MEMS and Single Electron Devices (SEDs)

 

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