Design Challenges in Nanometer-Scale Systems

Yusuf Leblebici, Full Professor, Microelectronic Systems Laboratory, EPFL

About the speaker: Yusuf Leblebici received the B.S. and M.S. degrees in electrical engineering from Istanbul Technical University in 1984 and 1986, respectively, and the Ph.D. degree in electrical and computer engineering from the University of Illinois at Urbana-Champaign in 1990. From 1991 to 1993 he worked as Visiting Assistant Professor of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. From 1993 to 1998, he was on the faculty of Istanbul Technical University as Associate Professor of Electrical Engineering. He also worked as a senior designer and project manager at ETA ASIC Design Center, Istanbul. From September 1996 to March 1998, he was an Invited Professor in the Department of Electrical Engineering, at the Swiss Federal Institute of Technology in Lausanne (EPFL).

Dr.Leblebici worked as Associate Professor of Electrical and Computer Engineering at Worcester Polytechnic Institute (WPI) in Massachusetts between 1998 and 2000, where he established and directed the VLSI Design Laboratory, and also served as a project director at the New England Center for Analog and Mixed-Signal IC Design. From 2000 to 2001, he took the responsibility of developing the microelectronics degree program at Sabanci University, as the Microelectronics Program Coordinator. He also continued his academic involvement at WPI during this time, as an affiliate associate professor.

Beginning in January 2002, Dr. Leblebici became a full (chair) professor at the Swiss Federal Institute of Technology in Lausanne (EPFL), and director of the newly established Microelectronic Systems Laboratory. His research interests include design of high-speed CMOS digital and mixed-signal integrated circuits, computer-aided design of VLSI systems, intelligent sensor interfaces, modeling and simulation of semiconductor devices, and VLSI reliability analysis.

Dr. Leblebici is the coauthor of two textbooks, Hot-Carrier Reliability of MOS VLSI Circuits (Kluwer Academic Publishers, 1993) and CMOS Digital Integrated Circuits: Analysis and Design (McGraw Hill, 1996 and 1998), as well as numerous scientific articles published in international journals and conferences.